NISA’, A.; HAKIM, M. H.; HARIYANTO, Y. A. Analysis of Differences Electric Field Exposure Value in Bean (Phaseolus vulgaris L.) Seeds on The Length of The Produced Plant. Jurnal Agritechno, [S. l.], v. 14, n. 2, p. 76–80, 2021. DOI: 10.20956/at.v14i2.487. Disponível em: https://agritech.unhas.ac.id/ojs/index.php/at/article/view/487. Acesso em: 22 nov. 2024.