Nisa’ A, Hakim MH, Hariyanto YA. Analysis of Differences Electric Field Exposure Value in Bean (Phaseolus vulgaris L.) Seeds on The Length of The Produced Plant. at [Internet]. 2021 Oct. 29 [cited 2024 Apr. 28];14(2):76-80. Available from: https://agritech.unhas.ac.id/ojs/index.php/at/article/view/487